Dual-Process Reference Artifact for Arm Verification
Confirm your arm is measuring accurately with Brunson’s ArmBar:250—providing critical verification for contact or non-contact devices.
Brunson’s new ArmBar:250 is a 250 mm reference artifact allowing dual-process verification of the arm’s probing tip OR scanner functions. Using Brunson’s patented Low Thermal Expansion (LTE) design, the ArmBar:250 gains additional stability and measurement predictability through a kinematic mount.
The reference artifact features 1” diameter, grade 50, satin-finish spheres and a 6 mm probe tip seat. The ArmBar:250 is easily mounted to a work cart, can be bolted to a table or clamped to any horizontal surface.
Serialized and certified lengths are included. Aluminum base plate. Easily portable, the ArmBar:250 comes with a protective, hard-plastic storage case.
Before your next critical measurement, verify that your arm is measuring accurately with Brunson’s ArmBar:250.
The Armbar:250 is certified with a NIST traceable measurement that includes an expanded uncertainty of ±0.007 mm at a 95% confidence interval. Patent pending.
